Nikolaos Eftaxiopoulos Sarris - Microlab

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Nikolaos Eftaxiopoulos Sarris

eftaxiopoulos@microlab.ntua.gr

Dr. Nikolaos Eftaxiopoulos is currently working as a cybersecurity consultant. He received his Diploma and Ph.D. degree from the Department of Electrical and Computer Engineering, National Technical University of Athens (NTUA), Greece, in 2012 and 2016, respectively. During his Ph.D. studies, he served as a teaching assistant, and his research was focused on radiation-tolerant integrated circuits. He has published 11 technical and research papers in peer-reviewed international journals and conferences. He has worked on the research projects THALES-REIN and THALES-HOLISTIC.

Journals

DIRT latch: A novel low cost double node upset tolerant latch

Microelectronics Reliability, Vol. 68, Pages 57-68, Jan. 2017

Low latency radiation tolerant self-repair reconfigurable SRAM architecture

Microelectronics Reliability, Vol. 56, Pages 202-211, Jan. 2016

Conferences

Low leakage radiation tolerant CAM/TCAM cell

IEEE 21st International On-Line Testing Symposium (IOLTS), Pages 206-211, 6-8 Jul. 2015

Nikolaos Eftaxiopoulos Sarris ,
N. Axelos ,
Georgios Zervakis ,
Kostas Tsoumanis and
Kiamal Pekmestzi

Delta DICE: A Double Node Upset resilient latch

IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS), Pages 1-4, 2-5 Aug. 2015

Georgios Zervakis ,
Nikolaos Eftaxiopoulos Sarris ,
Kostas Tsoumanis ,
N. Axelos and
Kiamal Pekmestzi

A segmentation-based BISR scheme

19th Asia and South Pacific Design Automation Conference (ASP-DAC), Pages 652-657, 20-23 Jan. 2014

N. Axelos ,
Nikolaos Eftaxiopoulos Sarris ,
Georgios Zervakis ,
Kostas Tsoumanis and
Kiamal Pekmestzi

FF-DICE: An 8T soft-error tolerant cell using Independent Dual Gate SOI FinFETs

IEEE 20th International On-Line Testing Symposium (IOLTS), Pages 200-201, 7-9 Jul. 2014

Nikolaos Eftaxiopoulos Sarris ,
N. Axelos ,
Georgios Zervakis ,
Kostas Tsoumanis and
Kiamal Pekmestzi

An independent dual gate SOI FinFET soft-error resilient memory cell

9th International Design & Test Symposium (IDT), Pages 39-44, 16-18 Dec. 2014

Georgios Zervakis ,
Nikolaos Eftaxiopoulos Sarris ,
Kostas Tsoumanis ,
N. Axelos and
Kiamal Pekmestzi

A high radix montgomery multiplier with concurrent error detection

9th International Design & Test Symposium (IDT), Pages 199-204, 16-18 Dec. 2014

High performance MAC designs

9th International Design & Test Symposium (IDT), Pages 30-35, 16-18 Dec. 2014

A radiation tolerant and self-repair memory cell

IEEE 19th International On-Line Testing Symposium (IOLTS), Pages 210-215, 8-10 Jul. 2013